Used PHILIPS / FEI XL 40 #293659624 for sale

PHILIPS / FEI XL 40 scanning electron microscope (SEM) is an advanced analytical tool designed for superior signal resolution and resolution-based imaging. With a range of features, including high-precision positioning and automated sample handling, this microscope is ideal for sample characterization, structure analysis, and advanced imaging. The SEM operates by using a focused beam of electrons to excite secondary electrons from a specimen surface. These secondary electrons, which are detected and amplified by the SEM, allow for the imaging of a sample down to the atomic level. This technique allows for resolution that is unmatched in other microscopy techniques. FEI XL 40 is equipped with an extendedeld inlens detector, allowing for the observation of the sample in three dimensions. This detector provides an image contrast and clarity that is comparable to a core-level photograph. In addition, PHILIPS XL-40 has an optional low vacuum system which enables imaging without specimen charging, allowing for the study of electrically sensitive materials. The microscope also features electronic focusing and focus drift compensation tuning, which ensures that the sample stays in sharp focus, as well as efficient sample preparation and automated sample stage moves. All of these features make PHILIPS XL 40 one of the most advanced SEMs on the market. XL 40 is designed to provide unparalleled performance and reliability for any application. With its range of features, precision positioning, and automated sample handling, this SEM is a perfect choice for applications that require superior resolution and imaging. For organizations pursuing excellence in sample analysis, XL-40 is the perfect scanning electron microscope.