Used PHILIPS / FEI XL 40 #293665913 for sale

PHILIPS / FEI XL 40 scanning electron microscope (SEM) is a reliable and versatile tool for precision engineering and material science applications. It is equipped with a powerful electron beam that can produce high-resolution images of samples at magnifications up to 70,000X. FEI XL 40 is ideal for imaging thin, fragile samples, such as 2D materials, and can be used to effectively analyze the surfaces of a wide variety of materials, including metals and semiconductors. PHILIPS XL-40 is powered by an EcoPlane ultra-high vacuum (UHV) chamber that maintains a clean, high-vacuum environment essential for producing high-quality images. This chamber has a 10,000-hour mean time between failures (MTBF), ensuring reliability and accuracy over a long period. Additionally, image resolution is actively measured and automatically corrected to ensure consistently accurate results over time. FEI XL-40 also has a motorized stage to accommodate larger, heavier samples, and can be controlled with a joystick for precise and easy manipulation. To enable fast and accurate measurement of specimens, XL-40 is equipped with a suite of specialized feature-analyzing and data-acquisition software. Digital image capture is enabled to save images for further analysis, and PHILIPS XL 40 can easily import and export images. Additionally, the software can be used for automated sample control, automated image alignment, and for creating elemental maps which reveal the composition of patterns on the specimen's surface. XL 40 is capable of producing a variety of images, including secondary and backscatter electrons, cathodoluminescence, x-ray maps, and elemental maps. This versatility allows it to be used in a wide range of applications, from inspection and imaging of semiconductor devices to studying ceramic and metal surfaces. The meticulous processing and analysis of samples enabled by PHILIPS / FEI XL-40 can open the door to valuable insight into a variety of materials and microstructures.