Used PHILIPS / FEI XL 40 #9049866 for sale

PHILIPS / FEI XL 40 scanning electron microscope (SEM) is a powerful imaging tool for characterizing a variety of materials. It is a piece of equipment used to study the surface-topography and composition of specimens down to the nanoscale level. It has the ability to magnify specimens up to x115,000, with a resolution of 0.50nm, and an image clarity and depth around 1nm. The source of illumination is an electron gun, which shoots electrons onto a phosphor screen. These electrons then interact with the target material, producing secondary electrons which are captured by the detector and then displayed on a monitor as an image. FEI XL 40 SEM has an extensive range of imaging capabilities such as backscatter imaging, secondary electron imaging, and cathodoluminescence. It can also be used for the analysis of non-conductive materials using a specialized gun that is capable of generating secondary electrons. Furthermore, the SEM has the ability to detect chemical composition of a material through energy dispersive x-ray (EDX) analysis. This equipment's software provides various image processing and analysis techniques, which allow the user to make accurate measurements of specimens, extract mappings of macroparticle distributions, and greatly expand the capabilities of the microscope. PHILIPS XL-40 SEM has a large chamber size that provides a large field of view, generally 560 mm x 330 mm. It can accommodate large samples up to 30" x 24" and provide resolution down to 1nm when imaging in low vacuum mode. This SEM has a built-in liquid Nitrogen (LN2) cryo-holder that allows for the analysis of specimens at temperatures as low as -196°C. Finally, this equipment has an automated sampler and sample manipulator that are able to move and rotate samples, allowing for the analysis of samples that have previously been impossible due to size or shape. PHILIPS / FEI XL-40 SEM is an essential tool when it comes to characterizing samples in industry, engineering, and scientific research. With its extensive imaging and analysis capabilities, the capabilities of the SEM can be used to identify material performance and structure, produce detailed maps of the specimens' surfaces, and gain insight into material chemistry. Additionally, the automated sample manipulation and LN2 cryo-holder features further enhance the capabilities of the device for specialized applications that require extremely low temperatures or manipulation of the specimen.