Used PHILIPS / FEI XL 40 #9164730 for sale

ID: 9164730
Electron microscope.
PHILIPS / FEI XL 40 is a scanning electron microscope designed for advanced imaging of small areas of specimens. It has an ultra-high resolution of up to 0.7 angstroms, enabling users to produce highly detailed surface images. The unique triple beam design of FEI XL 40 produces superior images with minimized background noise and offers greater flexibility when controlling electron beam characteristics. The microscope has a variable accelerating voltage range from 10-30kV, allowing for a wide range of magnifications and imaging resolutions. PHILIPS XL-40's magnification capabilities include a range from 500x up to 700,000x. The microscope also has a field emission gun (FEG), which allows for super-fine planar resolution of less than 1nm for imaging ultra-fine features on specimens. The large area CCD camera allows for fast scanning of samples up to 25mm x 25mm in size while still providing exceptional quality images. This high resolution imaging combined with advanced image analysis capabilities has made PHILIPS XL 40 an industry standard for the analysis of samples of engineering materials. XL-40 also has the ability to perform imaging in both low and high vacuum environments. This enables users to image delicate samples that may not survive in regular high vacuum conditions without suffering damage. Likewise, FEI XL-40 can be set up for both environmental and immersion scanning electron microscopy, which makes it ideal for the analysis of both organic and inorganic samples. PHILIPS / FEI XL-40 is equipped with a variety of accessories to maximize user flexibility. The variable pressure system allows users to adjust the pressure of the environment to suit the needs of the sample. Special accessories include a cryo-holder for delicate samples, as well as a rotatable stage to allow for further imaging possibilities. Additionally, the programming capabilities of the microscope can be extended via user-defined software scripting. XL 40 is a technologically advanced scanning electron microscope well-suited for any advanced lab imaging needs. Its combination of ultra-high resolution, excellent imaging resolution, and flexible accessory options make it a great choice for imaging small area specimens or delicate samples.
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