Used PHILIPS / FEI XL 40 #9249027 for sale

PHILIPS / FEI XL 40 is a state-of-the-art scanning electron microscope (SEM) used for imaging and analysis of a variety of biological and materials samples. It features a high resolution optical column, equipped with an automated variable pressure equipment and incorporates the latest EDS detector. This SEM imaging system boasts an acceleration voltage up to 40 KV, as well as a windowless field emission gun for high brightness, low-noise operation. Its fast-scanning technology provides images with 60 µm resolution, allowing for the detailed characterization of samples at the microscale level. Additionally, FEI XL 40 has a sample loading and sputtering unit with a motorized manipulator which facilitates specimen transferring, enhancing user experience. In addition to its optical capabilities, PHILIPS XL-40 offers a significant range of analysis instruments for compositional analysis, including energy dispersive spectroscopy (EDS). With an energy range up to 30 keV, this EDS detector allows users to accurately identify and quantify elements up to the elemental limit. Furthermore, PHILIPS XL 40 includes a dedicated In-Lens-Detector which provides fast mapping at low beam doses and an Everhart-Thornley detector, perfect for charge compensation. It also has a robotic stage XYZ automation, which enables rapid and simultaneous sample positioning, providing users with the ability to image and analyze subsequent images of multiple points on one sample. Last but not least, PHILIPS / FEI XL-40 includes user-friendly software, with a large range of imaging and analysis tools. In conclusion, XL 40 is a high-end SEM imaging machine, offering a comprehensive range of imaging and analysis capabilities for applications in academia, research and industry. With its optical and EDS detectors, automated systems and comprehensive software, this SEM instrument can provide images with superior resolution and analysis with maximum precision.