Used PHILIPS / FEI XL 40 #9250114 for sale

PHILIPS / FEI XL 40 is a scanning electron microscope (SEM) designed to deliver high resolution imaging and analytical capabilities. It is equipped with an in-column direct detector, which provides an unprecedented level of resolution. FEI XL 40 is capable of imaging a wide variety of structures and materials at a resolution down to 1.5 nanometers. This makes it an invaluable tool for the study of nanoscale structures and materials. PHILIPS XL-40's in-column detector, or EDX, is a spectrometer which is used to study the elemental composition of a sample. As electrons interact with a sample, they lose energy. EDX measures the energy losses and creates an elemental map of the sample, revealing the elemental composition and distribution. This makes it possible to study both morphological and chemical features in a single analysis. PHILIPS / FEI XL-40 is also fitted with an advanced stage, allowing it to achieve location accuracy of 0.5 nanometers. This stage is also equipped with the AutoAlign alignment system, which ensures that the sample is always correctly positioned for imaging and analysis. The stage can accommodate samples of up to 100mm in diameter. XL-40 is perfect for a variety of materials and sample types. Its variable pressure system allows for the imaging of low-vacuum samples, such as liquids and biological particles. In addition, the backscattered electron detector provides high contrast images which are ideal for the analysis of thicker samples, such as plastics, ceramics and metals. XL 40 has a range of high-performance analytical tools, allowing it to be used for a variety of applications. These include the ability to image and analyze samples in 3D, to perform topographical, compositional and phase analysis, and to measure grain size and distribution. It also features intelligent sample handling, ensuring that samples are always accurately positioned and positioned for analysis. In summary, FEI XL-40 is a powerful scanning electron microscope which offers unparalleled resolution and analytical capabilities. Its in-column EDX detector, high-precision stage and variable pressure system make it ideal for a wide range of applications, from imaging low-vacuum samples to topographical, compositional and phase analysis. It provides an advanced level of control and intelligence, making it the perfect choice for nanoscale applications.