Used PHILIPS / FEI XL 40 #9276331 for sale

PHILIPS / FEI XL 40 is a state-of-the-art scanning electron microscope (SEM) that utilizes a scanning electron beam to create images of the surface of a material or specimen. FEI XL 40 operates in a vacuum environment, where electrons are accelerated to produce an image on a detector or photosensitive material. The electron beam is scanned across the surface of the specimen and the electrons are collected as they impinge the specimen. These electrons create a two-dimensional picture of the surface. PHILIPS XL-40 has a range of magnifications from 5x to 500,000x. The magnification range is achieved by using electrons at various accelerating voltages from 1 kV to 30 kV. XL 40 is an environmental SEM, meaning it has a number of capabilities for creating high-resolution images under a variety of environmental conditions. These included variable humidity and temperature control, gas delivery, and liquid sample delivery. PHILIPS XL 40 also has the capability to perform both secondary and back-scattered electron (BSE) imaging. BSE imaging uses the electrons that are scattered off the surface of the specimen to create an image. This imaging technique can provide insight into a sample's topography, elemental composition, and thickness of the material being studied. In addition to the SEM capabilities, FEI XL-40 also includes a number of advanced features that enhance its performance. These features include a high-resolution camera system, analytical features such as EDS, EBSD, and WDS, sample carbon coating capability for non-conductive specimens, and a variety of detectors to image the sample in different modes. XL-40 is a versatile and powerful tool for researchers in the field of materials science and nanotechnology. Its combination of imaging capabilities, analytical features, and environmental control will provide researchers with insight into the properties of their materials and specimens that could not be achieved with conventional microscopy techniques.