Used PHILIPS / FEI XL 50 #293617794 for sale

PHILIPS / FEI XL 50 is a state-of-the-art scanning electron microscope (SEM) that is capable of delivering high-resolution images at a very fast rate. FEI XL 50 is built on advanced FEI FEG SEM technology, allowing for an optimized image quality, as well as higher throughput and better resolution for both low- and high-voltage modes. PHILIPS XL50 is equipped with an EsB high- through-put electron column that allows for a beam intensity of up to 200nA with a voltage of 1-30kV. This electron source provides a fast spot size and the highest brightness of any SEM available on the market. Additionally, XL50 allows for the best possible signal-to-noise ratio of any high-resolution SEM. PHILIPS / FEI XL50 features an advanced environmental chamber that is designed to ensure the preservation of samples even under extreme conditions. This environmental chamber protects the sample from contamination and oxidation, preserving the sample's integrity. PHILIPS XL 50 also features a high-performance chamber that provides a very low vacuum, allowing for the analysis of the sample in a range of environments. Its low-vacuum equipment enables high-resolution imaging and analysis without any sample damage. FEI XL50 is equipped with an advanced imaging system that provides resolutions of up to 50nm, allowing for the observation of near-atomic scale features. Its imaging unit includes a coplanar electron sensor, digital signal processor, and automated single frame retrieval. This imaging machine is incredibly efficient and allows for image sequences up to ten times faster than traditional SEM imaging systems. XL 50 is a powerful SEM that is designed to deliver highly resolved images at an extremely fast rate. Its exceptional capabilities make it the perfect choice for a variety of imaging applications, including material science, biology, and nanotechnology.