Used PHILIPS / FEI XL 820 #9243141 for sale
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PHILIPS / FEI XL 820 Scanning Electron Microscope (SEM) is a versatile and powerful tool that is used to provide high resolution imaging and analysis of samples. The SEM's impressive resolution, contrast and detail capabilities make it ideal for a wide range of scientific applications, such as materials and life sciences, as well as industrial and electronics analysis. The open design of FEI XL 820 SEM allows a variety of sample sizes, shapes and thicknesses to be imaged-up to 295mm long and 150mm high in the vertical direction. The highest resolution available is approximately 3nm in both lateral and depth direction, making it possible to detect and analyse even the smallest features at the nano-scale level. Furthermore, PHILIPS XL 820 has the unique facility to incorporate an "in-lens" secondary electron detector that provides high-contrast imaging of insulating and resistive materials - with no charging effects. The SEM is equipped with an automated environmental chamber for in situ analysis and variable pressure (VP) technology which enables imaging and analysis in low vacuum environment (e.g. in air, liquids or gasses). It is also capable of screen-type sample destruction, making it especially suitable for failure analysis. It has an automated alignment system that allows it to directly measure profiles over large length ranges with complex geometry. XL 820 SEM is complemented by advanced data acquisition and image processing software. This software provides a highly efficient way to analyze data and generate results. It allows the user to produce 3D image models, measure distances, calibrate features and even perform spectral analysis. In summary, PHILIPS / FEI XL 820 SEM is a powerful tool that provides excellent resolution, contrast and detail capabilities. It is the ideal solution for a wide range of microscopic analysis applications, from materials and life sciences to industrial and electronics. The unique features and advanced software make it an invaluable asset for the research and development environment.
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