Used PHILIPS / FEI XL 830 #293627422 for sale

PHILIPS / FEI XL 830 Scanning Electron Microscope (SEM) is an advanced imaging instrument used for the analysis of surface features, composition and morphology. This sophisticated SEM offers a wide range of features, ideal for physical, chemical and materials science applications. FEI XL 830 is a fully automated SEM with a field emission source and a high-resolution digital signal processor. The combination of these components allows for the highest level of performance and versatility. With the flexible imaging capabilities, users can manipulate the swing, tilt, range and tuner settings quickly to display low and high-resolution images with fine detail. The microscope is also capable of imaging in both conventional and STEM (Scanning Transmission Electron Microscopy) mode. PHILIPS XL 830 also allows for advanced sample preparation and analysis. The high-resolution digital signal processor enables users to properly target the desired area to be analyzed, while the sample preparation chamber allows for fine manipulation of samples to allow for the best analysis possible. The high-intensity electron beam and backscatter imaging techniques make it possible to analyze the compositional and structural properties of samples at the atomic scale. XL 830's high-power analytical capabilities matched with its easy-to-use software and system components makes it a great asset for any research laboratory. Its flexibility allows for the electron beam to be used in a variety of image modes including secondary and backscattered imaging for the examination of organic and inorganic samples. In addition, the system is equipped with a variety of analytical capabilities including energy dispersive X-ray (EDX) spectroscopy, energy-filtered transmission electron microscopy (EFTEM), and wavelength dispersive X-ray (WDS) spectroscopy. These analytical capabilities make PHILIPS / FEI XL 830 an effective tool for conducting elemental, spatial or compositional analyses of samples at the nanometer scale. Overall, FEI XL 830 is a versatile and powerful scanning electron microscope that enables users to perform analysis at a range of resolutions with ultra-high precision. Its digital signal processor and variable controls maximize ease-of-use and reliability, while its high-powered analytical capabilities provide a broad range of information about samples at the atomic level. Its flexibility and advanced features make it an ideal choice for a variety of research applications in the fields of physical, chemical and material sciences.