Used PHILIPS / FEI XL 830 #293653200 for sale

PHILIPS / FEI XL 830
ID: 293653200
Focused Ion Beam Scanning Electron Microscope (FIB-SEM).
PHILIPS / FEI XL 830 is a top-of-the-line scanning electron microscope (SEM) designed for research and industrial applications. It features three independent electron columns for maximum versatility, enabling observation of complex and intricate structures at resolutions down to 2 nanometers. The SEM is equipped with a detection system that offers maximum contrast and resolutions up to 50 nanometers, providing users with optimal imaging capabilities. FEI XL 830 features an ability to view large fields of view in real time, which is enabled by its suite of high-end imaging tools. These include a digital camera, digital image analysis software, and 3D imaging. The digital camera allows for the capture of high-resolution images, while the image analysis software is used to interpret the collected images. Finally, the 3D imaging process gives users the ability to view specimens from multiple angles, allowing them to get a fuller understanding of the sample's intricate details. PHILIPS XL 830 is also equipped with a laser system for specimen preparation, which allows users to accurately cut and slice specimens without causing damage. This SEM is also capable of elemental analysis, which makes it an ideal tool for analyzing a variety of materials. The high resolution, coupled with the integrated detectors, makes it an invaluable tool for materials science studies. XL 830 is user-friendly, with an easy-to-use interface and ergonomic controls. The LCD display lets users monitor their imaging process, making it easy to adjust the microscope settings for optimal imaging. It also features automated scanning, which can run scans unattended for extended periods of time, making it a suitable choice for high throughput labs. In conclusion, PHILIPS / FEI XL 830 is a high-performance scanning electron microscope that delivers excellent imaging capabilities and versatility. It is an ideal choice for a wide range of materials analysis applications, offering high image resolutions, superior contrast, and the ability to analyze a variety of materials. With automated scanning and an ergonomic design, FEI XL 830 is a top-of-the-line instrument suitable for any research and industrial setting.
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