Company
Why CAE?
Our History
Leadership
Marketplace
Front End Processing Equipment
Diffusion Furnaces & Accessories
Etchers / Ashers
Evaporators
Exposure Systems
Flat Panel Display
Ion Implanters & Monitors
Ion Milling
Lasers
Mask & Wafer Inspection
Mask Aligners
Back End Processing Equipment
Bonders
Burn-in Systems
Die Attachers
Electronic Test Equipment
Final Test
Handlers
Lasers
Marking Machines
Ovens / Furnaces
Packaging
PC Board Assembly And Manufacturing Equipment
PC Board Assembly And Manufacturing
PC Board Test
Pcb Solder Machines
Power Supplies
Spare Parts
X-ray
Placement Machines
Screen Printers
PC Board Inspection
Reflow Ovens
Lab Equipment
Centrifuges
Ellipsometers
Environmental Chambers
Lab Equipment And Accessories
Laminar Flow And Fume Hoods
Lasers
Leak Detectors
Microscopes
Optical Comparators
Ovens / Furnaces
Facilities Equipment
Chillers - Industrial
Chillers - Recirculating, Heat Exchangers
Facilities Equipment
Gas Cabinets
Leak Detectors
Machine Tools
Particle Counters
Power Supplies
Pumps
Residual Gas Analyzers
View all
Careers
Available Positions
Training Program
Contacts
Search
0
Deutsch
Français
한국어
日本語
中文(繁體)
中文(简体)
Marketplace
Scanning Electron Microscopes
PHILIPS / FEI
XL 830
#293754265
Used PHILIPS / FEI XL 830 #293754265 for sale
Share
Email
Facebook
Twitter
Weibo
URL successfully copied!
Request Price
Add to Cart
Remove from Cart
Scanning Electron Microscopes
Manufacturer
PHILIPS / FEI
Model
XL 830
Equipment Details
Reviews
ID:
293754265
Dual beam Focused Ion Beam Scanning Electron Microscope (FIB-SEM).
Read More
Close
There are no reviews yet
Add review
CAE uses cookies to improve your interaction with the website.
Yes, I agree
Cookies Policy
