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Scanning Electron Microscopes
PHILIPS / FEI
XL 830
#293758289
Used PHILIPS / FEI XL 830 #293758289 for sale
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Scanning Electron Microscopes
Manufacturer
PHILIPS / FEI
Model
XL 830
Equipment Details
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ID:
293758289
Focused Ion Beam Scanning Electron Microscope (FIB-SEM).
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