Used PHILIPS / FEI XL 835 #293639215 for sale

PHILIPS / FEI XL 835
ID: 293639215
System.
PHILIPS / FEI XL 835 is a high-performance scanning electron microscope (SEM) with a wide range of capabilities. This instrument is designed to offer flexibility and precision in imaging and analysis. FEI XL 835 features a large number of advanced technological features. It possesses a light-frame electron column with a mission-aligned Schottky emitter in order to provide superior image quality. The specimen chamber is equipped with an automated specimen transfer system allowing for fast and easy sample exchange. The column of the instrument has an energy range between 20 and 30kV. A previous generation detector can be used for sample analysis. The backscattered electron (BSE) and secondary electron (SE) detectors enable the analysis of specimen topography and elemental composition. PHILIPS XL 835 also has a high-resolution Everhart-Thornley SE detector, allowing for greater analysis accuracy. XL 835 operates at vacuum levels as low as 10 -8 mbar, ensuring a clear view of the sample. The SEM performs automated measurements, as well as manual control, thanks to the intuitive 4D joystick. Its modular design makes it easy to upgrade components and add software. The remarkable imaging capabilities of PHILIPS / FEI XL 835 makes it an ideal instrument for applications such as microstructure characterization, research, or failure analysis. It provides superior resolution with minimal specimen drift, allowing for high-resolution analysis of minute details. The electron column also enables imaging in various operating modes, including bright field, dark field, and polarization. FEI XL 835 provides a wide range of powerful analysis techniques, such as Energy Dispersive Spectroscopy (EDS), X-ray mapping, and image simplification. The software is designed to perform advanced functions such as 3D images, movie making, and measurements. The integrated real-time cinematic filter allows for ultra-high-speed imaging. Overall, PHILIPS XL 835 is a reliable and efficient laboratory instrument that delivers precision and accuracy in imaging and analysis. This scanning electron microscope is a perfect choice for researchers and laboratories requiring in-depth elemental and structural analysis.
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