Used PHILIPS / FEI XL Sirion #293636315 for sale

PHILIPS / FEI XL Sirion Scanning Electron Microscope (SEM) is an advanced imaging equipment used to study a variety of microscopic features and materials. This SEM is equipped with an in-column "FEG" field emission gun (FEG) technology, making it a powerful tool for examining particles on the nanoscale. The FEG produces high-energy electrons that can penetrate thin samples, allowing for higher resolution images. Its patented Schottky field emission source (SFES) technology enables the imaging system to produce ultra-high contrast, high-resolution images. The in-column gun design and radiation-protection shielding allows for a simpler installation process and minimized risk of mechanical damage. The SEM also offers impressive imaging capabilities. With a resolution of up to 1.4 nanometers, the unit is well-suited for studying highly detailed structures, such as nanoscale particles, thin films, and other delicate materials. The intuitive touchscreen interface allows for quick and easy customization of contrast, brightness, and resolution levels. This imaging machine can also acquire multiple images, allowing for the generation of 3D reconstructions and high-resolution mapping. The automatic alignment feature of FEI XL Sirion makes execution of experiments fast and easy. The alignment process reduces the amount of time needed to orient the sample and thereby quickens operations and makes ongoing experiments easier to complete. Additionally, PHILIPS XL Sirion offers an automated surface chemistry analysis feature that enables the characterization of materials without extensive sample preparation. Finally, XL Sirion SEM is also capable of a variety of imaging modes, including Low Vacuum, Variable Pressure, ESEM, and In-Situ modes. With these various imaging modes, users can explore materials and particles with improved ease, enabling them to acquire detailed information on their samples with greater accuracy.