Used RAITH / PREMTEK eLine #9382216 for sale

ID: 9382216
E-Beam lithography system Upgraded to PERIODIX PC Laser stage Lithography and nano-engineering workstation Universal sample holder: Up 2" square Pico ampere meter with IEEE-interface CCD Camera Electron beam lithography starter kit Manual included Precision optical microscope with illumination Precision 1x imaging optics Projection corrected optical arrangement Mounting and alignment set Optimized illumination LED with optics High resolution CCD Camera Frame grabber Fixed beam moving stage lithography module Wafer carrier, 3" Mask carrier, 4" Automated height sensor Manual load lock: Up to 100 x 100 mm With high vacuum gate valve Control electronics Oil free pumping system Filament Operating system: Windows 7.
RAITH / PREMTEK eLine is a scanning electron microscope (SEM), which is widely used for research, development, and industrial applications. It is designed to provide sharp imaging and high surface resolution for a variety of sample materials, including metals, semiconductors and insulation material. The SEM is made up of four main components - an ion column, an electron source, a blanking gun, and a stage. The ion column is used to focus and detect the electron beam. It is made from a highly stable Nikasil electrostatic coating, which helps to reduce heat loss and maintain a consistent beam current. The electron source produces a beam of electrons which is guided by electromagnetic coils and magnets within the source. The blanking gun is used to reduce the level of electron beam intensity, and the stage is used for sample manipulation. RAITH eLine is an advanced equipment that offers high accuracy in imaging and analysis. It comes with advanced imaging and analysis capabilities such as back-scattered electron imaging (BSE), fast scanning SE (FSSE), low-voltage SE (LVSE), and secondary electron microscopy (SEM). BSE is used to characterize the topographical features of the sample, while FSSE is used to capture ultra-fast imaging of dynamic processes. LVSE is used to generate high-resolution images of electron beam interactions with the sample, while SEM can generate high-resolution images using a beam of electrons. PREMTEK eLine also features a variety of built-in features, such as tilting stages for sample manipulation, micro-area imaging, automated specimen feeder, a vacuum system, and an automated pattern recognition unit. The pattern recognition machine allows for automated recognition of defects and features on the sample surface. It is capable of achieving resolutions down to 1nm. Its wide range of magnification, from 5x to 500,000x, allows for examination of extremely small features. Additionally, its high throughput allows for rapid image collection and analysis. ELine is an ideal choice for researchers and professionals who need a dependable and accurate SEM tool. With its advanced imaging and analysis capabilities, built-in features, and high magnification and resolution, RAITH / PREMTEK eLine is the perfect choice for a wide range of applications.
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