Used RAITH / PREMTEK ionLiNE #9402127 for sale

RAITH / PREMTEK ionLiNE is a scanning electron microscope (SEM) used for a variety of different types of imaging, ranging from ultra-low voltage up to several hundred volts. It has a 5-axis stage, offering high accuracy and large working area for long parts, and a high precision positioning system that enables imaging resolution down to the nanometer scale. RAITH ionLiNE is capable of both low and high voltage analysis, allowing for analysis of any type of material regardless of its size. The instrument is equipped with high-performance optics, which enable the imaging of surface details with an expansive field of view. PREMTEK ionLiNE has a variable spot size beam accelerating voltage, with a high transmission and an excellent beam flux for larger sample areas and a wide variety of sample sizes. It also has adjustable pressure and temperature protection, allowing the safe and reliable operation at high vacuum operation. For imaging, ionLiNE features a large field of view, three months of uninterrupted scanning, ultra-high resolution imaging, and excellent material contrast. It is equipped with an automated exposed surface analysis microscope, which can be used to monitor surface profiles, detect surface defects, and obtain 3D topography quickly. RAITH / PREMTEK ionLiNE has also integrated STEM, EBSD, and EDS systems for chemical, elemental, and crystallographic analysis. The user-friendly and intuitive software included with RAITH ionLiNE allows operation without any complicated scripting. The software also includes data acquisition, image analysis, image processing, and advanced statistical analysis tools. In addition, PREMTEK ionLiNE includes three advanced imaging techniques to extend the imaging capabilities: advanced serial section reconstruction, tilt stigmation, and drift correction. In conclusion, ionLiNE is an advanced scanning electron microscope with a wide range of features that make it suitable for almost any application. It has excellent imaging capability, capable of producing images at the nanometer scale, and advanced tools such as advanced serial section reconstruction, tilt stigmation, and drift correction enable extended imaging capabilities. The included intuitive software allows for operation without any complicated programming, making it ideal for users with limited experience in electron microscopy.