Used SEIKO SMI-8300 #9076932 for sale

SEIKO SMI-8300 scanning electron microscope (SEM) is a state-of-the-art instrument that utilizes a digital imaging detector equipment for visualizing samples in a variety of applications. It has a compact footprint, but still offers advanced features for a variety of sample analysis techniques. SEIKO SMI 8300 utilizes both a high-current electron gun and an adjustable accelerating voltage of up to 30 kV, which allows a wide range of samples to be observed and analyzed. The SEM incorporates a unique digital imaging detector system, which enables imaging of structures with an inherent resolution of 0.2 microns or better. The SEM has a wide range of automated functions for easy operation and user-friendly interface. SMI-8300 offers a wide range of imaging and analysis capabilities, including particle analysis, element mapping, grains analysis, particle size/shape analysis, and grain boundary analysis. The automated unit allows quick and easy changes between secondary and backscattered electron imaging modes. Automated functions allow the user to quickly change the working distance, beam current, and accelerating voltage for optimal detection. SMI 8300 also includes an automated stage control with a 0.5 μm resolution, which is ideal for alignment and sample positioning. The SEM is capable of operating in both the horizontal and the downward/upward directions. It is also equipped with an automated x-ray detector machine for fast and accurate elemental analysis. The detector also offers a range of resolution capabilities from 0.05 to 0.5 μm. SEIKO SMI-8300 combines excellent imaging and analysis capabilities with a simple operation and user-friendly interface. Its impressive features and automated functions make it an ideal choice for a variety of sample analysis applications. With its high-resolution digital imaging detector tool, the SEM caters to the imaging and analysis needs of a wide range of industry sectors including electronics and material sciences.