Used SELA / CAMTEK EM 2 #9126010 for sale

SELA / CAMTEK EM 2 scanning electron microscope is an advanced scientific instrument used for the examination and analysis of very small objects. The microscope works by directing a beam of electrons onto the specimen which are then scattered and detected through electrostatic detectors. SELA EM 2 has a working distance of 41.0 mm, and the maximum scanned area is 9.8 x 7.3 mm. The microscope has a variable accelerating voltage from 5 kV to 40 kV for both X-ray and electron imaging, and the capability of precise sample focus on the depth of 0.01 µm. It has a powerful imaging software suite and an integrated sample holder for ease of sample placement and observation. CAMTEK EM 2 has a large number of features for imaging and analysis. It has high definition digital imaging with 3D functionality, and fast scanning speeds. EM 2 has two versions of polarization microscopy, circular and linear polarization, for enhanced contrast and detail. The microscope has an in-depth elemental analysis feature, allowing the user to identify several elements in each image. Furthermore, the microscope is equipped with a semi-automated coating system, making it easy to prepare samples for observation. SELA / CAMTEK EM 2 also has a wide variety of utility features, such as the X-ray Fluorescence Spectrometry mode for surface analysis, and High Temperature/Low Temperature Imaging mode for thermal imaging studies. The microscope has integrated temperature control for specimen introduction, and is also equipped with an ion source for secondary ion mass spectrometry. This scanning electron microscope provides outstanding performance for both researchers and industrial users alike. Its multi-function approach and powerful software make SELA EM 2 a great tool for a wide range of applications. It provides the ability to visualize and analyze microscopic features with great precision and accuracy.