Used SELA / CAMTEK TEMpro #9314703 for sale

SELA / CAMTEK TEMpro is a scanning electron microscope (SEM) which offers a suite of advanced features for high-sensitivity, high-resolution Focused Ion Beam (FIB) imaging. The instrument is ideal for materials science, materials engineering, and nanotechnology applications. The higher resolution, greater sensitivity, and automation capabilities make the instrument well suited for 2D and 3D imaging. The focus of this SEM is electron beam interaction with materials. Its large sample chamber, with temperature control, enables a wide range of sample configurations. The instrument is equipped with a powerful STEM hyperbolic mirror column to provide high-quality imaging and increased electrical sensitivity. The SEM also utilizes a highly efficient backscatter electron detector (BSED) and cathodoluminescence (CL) detector for visualizing both light and dark components of a sample. SELA TEMpro has an automated HF discharge unit enabling easy preparation and imaging of insulators for reduced charging artifacts. The advanced Data Station Software includes automated pattern recognition, statistical analysis, and automated image collection. The software also allows for 3D reconstruction of 3D models, as well as image pattern recognition and data plotting. Advanced technology incorporated within CAMTEK TEMpro provides high-resolution imaging capability. High resolving power, as well as high resolution and high contrast imaging, are result of employing both a dynamic aperture and a variable-sized spot size. With a variable working distance, the instrument can optimize imaging resolution based on the level of detail needed for a particular application. The instrument has an automated FIB stage that allows for precise targeting of features on the sample. Combined with the integrated sample handling capabilities, users can quickly image a wide range of metal and organic materials. The integrated positioning and adaptive imaging capabilities enable target-centered optimization of imaging parameters. To maximize throughput, TEMpro is equipped with a fully integrated material polishing unit. This feature enables users to automatically polish samples as they are processed. The automated polishing unit allows for polishing of a wide variety of materials. Capabilities such as polishing direction and rate control provide improved imaging results. SELA / CAMTEK TEMpro provides easy access to a range of advanced robotic and automation features and tools, giving users even greater control over their imaging results. With this powerful imaging and automation system, users can conveniently capture and analyze submicron-scale features with very fine spatial resolution. The combination of top-level technical capabilities gives SELA TEMpro superior performance at a competitive price.