Used SHIMADZU SPM-9500J #9398388 for sale

SHIMADZU SPM-9500J is a high-performance scanning electron microscope (SEM) used for observing and measuring the surface of a specimen. It is designed for precision studies of a variety of samples from living organisms to materials and electronic devices. SPM-9500J is a field emission SEM that utilizes a powerful electron column to produce high resolution images of the specimen's surface. The electron column emits a beam of electron that are focused down to a narrow spot. As the electrons interact with the specimen, secondary and backscattered electrons are produced. These electrons are then detected and amplified for data collection. SHIMADZU SPM-9500J has a variety of features that make it ideal for analytical observation. It has a high resolution of up to 26,000x magnification and a large field of view of up to 450x450µm, allowing for the observation of samples at the nanoscale. The SEM can be equipped with a variety of detectors that detect various energy spectrum signals, allowing for the analysis of parallel energy and chemical imaging. It also has an integrated energy-dispersive X-ray spectrometer, which is used to collect information on the composition of the sample. With the EDX detector, users can determine the presence of different elements or measure the thickness of a film. SPM-9500J is also equipped with several automated functions that allow for faster and more efficient data collection. Analysts can use the automated Navigation and Focus function to quickly move to the desired location in the specimen and focus the beam on the appropriate area. The Automated Search and Measurement function assists with identifying and measuring surface features. With this function, surface parameters can be measured in one run, improving productivity and accuracy. SHIMADZU SPM-9500J is a powerful tool for the analysis and characterization of a variety of samples. With its ability to capture images at high resolutions, automated functions, and integrated detection systems, the system is ideal for observing and measuring nanostructures for research and industrial applications.