Used SII NANOTECHNOLOGY / SEIKO XV-300DB #9257399 for sale

The SII NanotechnologiesSII NANOTECHNOLOGY / SEIKO XV-300DB scanning electron microscope is an advanced research instrument used for examining microscopic particles. It is a variable pressure scanning electron microscope (SEM), capable of operating in high-vacuum and low-vacuum (less than 10-4) environments. This allows for a greater range of sample features and chemical and physical characterization of micro and nano particles. SEIKO XV-300DB utilizes a combination of electron sources such as the cathodoluminescence (CL) gun, backscatter electrons (BSE) gun, and secondary electron gun (SE). The CL gun uses an achromatic system which enables high spatial resolution along with autofocus control. The BSE gun uses an automated secondary electron detector which helps achieve better imaging contrast. The SE gun employs an electrostatic electron lens which provides high resolution imaging of particle surfaces. For magnification control, SII NANOTECHNOLOGY XV-300DB incorporates a patented advanced digital zoom technique with fingertip control. This allows the user to selectively zoom into areas of interest for finer points of analysis. In addition, XV-300DB offers three operating modes: manual, semi-automatic, and fully automatic modes which allow for efficient and accurate imaging and analysis. SII NANOTECHNOLOGY / SEIKO XV-300DB offers special features for specimen examination. Wider sample chambers allow for heavier specimens up to 500 grams, and the responsive auto-clean operation allows for quick specimen change-over. The instrument also allows for user-specified preparation techniques such as sputter-coating, metallization, and polymerization. SEIKO XV-300DB provides a range of specialized imaging techniques based on various interaction modes: analytical insights into sample composition, bulk subsurface imaging, ultrasharp imaging, and surface area measurements. It can also be adapted for use with multiple detectors: scanning thermal microscopy and atomic force microscopy tip detector for thermal analysis and raised-edge detection. Overall, the SII NanotechnologiesSII NANOTECHNOLOGY XV-300DB scanning electron is an enclosed insight into particle microstructures, providing a precise way to examine minute objects which can vastly improve data analysis and sample characterization.