Used TESCAN Mira3 #9308067 for sale
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ID: 9308067
Vintage: 2016
Field Emission Gun Scanning Electron Microscope (FEG-SEM)
Variable pressure field emission SEM
High brightness schottky field emitter
4-lens electron optical design
Detectors:
Everhart-Thornley SE/BSE (ETD)
Retractable BSE detector
In-Beam BSE detector
In-Beam SE detector
Low Vacuum Secondary Electron Detector (LVSTD)
Optics:
Resolution at high-vacuum SE mode
1.2 nm: 30 kV
2.5 nm: 3 kV
Resolution at high-vacuum In-Beam SE mode
1 nm: 30 kV
Resolution in low-vacuum mode LVSTD
1.5 nm: 30 kV
Resolution in beam deceleration mode:
1.5 nm: 3kV
2.5 nm: 200V
Maximum field of view: 100 mm
20 mm: 30 mm WD
EDX: BRUKER NANO QUANTAX 400 Energy Dispersive X-ray spectrometer
Dual 60 mm² XFlash detectors
Resolution: 126 eV Mn Kα, 60 eV F Kα, 51 eV C Kα
Element detection range: Beryllium (4) to americium (95)
Raman: WITEC RISE laser confocal microscope system
Laser:
Excitation wavelength: 532 nm, 75mW
2016 vintage.
TESCAN Mira3 is a field-emission scanning electron microscope (SEM) that is designed for the observation of biological and geological specimens, and other materials in a variety of fields. The microscope is based on TESCAN proprietary FEG (field emission gun) EMmi Electron Field Emission System, which delivers excellent resolution and contrast images which makes it well-suited for a variety of applications. Mira3 combines the stability and power of a conventional transmission electron microscope and a scanning electron microscope. This results in an instrument capable of delivering resolutions down to 5 nm, as well as high definition images with very high dynamics that can be used in the study of materials' microstructure. TESCAN Mira3 also can offer great versatility, as specimens can be observed in both SE (secondary electrons) and BSE (backscattered electrons) imaging modes. With an accelerating voltage range from 1 kV to 30 kV and an electron beam current from 0.5 nA to 10 nA, Mira3 is suitable for a wide range of sample requirements. The microscope's sample chamber is based on TESCAN innovative patent-protected tesselloplane holder. This holder ensures specimen stability even when working in accelerated voltage up to 30 kV, while also making specimen handling and specimen exchange a breeze. The microscope also features an in-column ion gun for post-processing, which allows etching of features, and the deposition of conductive coatings. Furthermore, TESCAN Mira3 is equipped with a novel sample characterization architecture for the measurement of relevant parameters such as conductivity, SIMS depth profiling, SEM elemental analysis, and chamber temperature measurement. When it comes to operation and usability, Mira3 features an intuitive Windows-based software package that offers various modular tools for easy sample preparation and analysis. This software includes features such as automatic image stitching, automated navigation, and various plugins designed to allow for synergistic operation with other analytical instruments including SEM-based EDX. In summary, TESCAN Mira3 provides researchers and technicians with a wide range of analytical techniques and an impressive level of resolution, making it a powerful and useful tool for many applications in the fields of life sciences, materials science, environment testing, semiconductor and metal research.
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