Used TESCAN VEGA III XMU #293624504 for sale
URL successfully copied!
Tap to zoom
ID: 293624504
Vintage: 2020
Scanning Electron Microscope (SEM)
Electron gun: Tungsten heated cathode
OXFORD XMaxN80 EDS
Filament lifetime: 200 Hours
Pneumatic chamber and column suspension
Magnification: 1x to 1000000x
Electron beam energy: 200 eV to 30 keV
Probe current: 1 pA to 2 µA
Ion pump non-functional
(2) Displays, 24"
Resolution:
High vacuum mode (SE):
3 nm at 30 kV
8 nm at 3 kV
Low vacuum mode (BSE): 3.5 nm at 30 kV
Field of view:
7.7 mm at WD 10 mm
24 mm at WD 30 mm
Chamber vacuum:
High vacuum mode: < 9 x 10^-3 Pa
Low vacuum mode: 3 Pa - 500 Pa
(12) Ports
Specimen stage:
Type: Compucentric
Movements:
X: 130 mm (-50 mm to +80 mm)
Y: 130 mm (-65 mm to +65 mm)
Z: 100 mm
Rotation: 360° (Continuous)
Tilt: -30° to +90°
Detectors:
SE
R-BSE
pA Meter
Touch alarm
IR TV Camera
PC: INTEL Core i3-4160 Dual, 3.6 GHz, 8 GB RAM
Hard Disk Drive (HDD): 500 GB
Operating system: Windows 10 Pro
2020 vintage.
TESCAN VEGA III XMU scanning electron microscope (SEM) is a high-performance instrument renowned for providing superior imaging capabilities and superior resolution. With its advanced, high-precision design, VEGA III XMU is capable of producing close-to-electron-beam quality images for all types of material studies. TESCAN VEGA III XMU works with a wide range of capabilities and spectra of features, all of which are designed to maximize the SEM's imaging capabilities. It provides high-resolution, high-precision scanning with a maximum resolution of 0.22 nm and a resolution minimum of 0.62 nm, as well as high-resolution energy-filtered images. Its advanced imaging capabilities enable VEGA III XMU to reveal fine details and structures in a variety of materials. Developed with a unique gun technology, TESCAN VEGA III XMU has an advanced, high-spectral X-ray microanalysis system that allows for accurate detection and measurement of individual elements. In addition to providing an improved imaging system thegun technology also provides longer X-ray spectra and improved power stability, both of which improve the ability to analyse samples accurately. VEGA III XMU is also equipped with a highly sensitive backscatter detector for elemental imaging as well as a sensitive secondary and backscatter detector for both energy-filtered imaging and energy-filtered element mapping. Additionally, it is also equipped with a proprietary laser autofocus system that allows for easy fine-tuning of the focus and the geometry of the electron beam. TESCAN VEGA III XMU has a wide range of advanced software functions, all of which are designed to provide the user with intuitive software control and investigation possibilities. The proprietary TESCAN data-analysis software suite, in particular, provides an extensive selection of graphical tools, including signal processing, elemental mapping, and imaging analysis functions. In addition to the software, VEGA III XMU offers advanced hardware features including sample holder vibration isolation, high-performance gun heater control, and automated airlock. Overall, TESCAN VEGA III XMU is a top-tier scanning electron microscope that not only provides impressive imaging capabilities but also offers high-precision performance for materials studies. Its proprietary gun technology and software suite provide the user with advanced experimental possibilities, allowing for increased resolution and enhanced imaging capabilities for a full suite of materials analysis.
There are no reviews yet