Used TESCAN Vega3 SBH #9363437 for sale
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ID: 9363437
Scanning Electron Microscope (SEM)
Tungsten based vacuum
Mechanical suspension for chamber
3-Axis motorized stage with position readout
SE detector
pA meter
Beam blanker
Draw beam expert: Used for EBL
Monitor, 24"
Track ball
64-Bit PC
Rotary vane pump
Transformer.
TESCAN Vega3 SBH is a scanning electron microscope (SEM) designed for a wide range of material analysis applications. It offers superior analytical performance and features a wide range of detection and imaging capabilities. It combines quick accelerators with an advanced specimen stage, enabling users to study a variety of materials with great accuracy and detail. The device offers a range of imaging options, including bright field, dark field, and backscatter imaging. The bright field option provides images with very good image contrast, while the dark field option allows one to study surface features with greater detail. The backscatter option permits users to find the deepest features with a higher contrast. The user interface of the device is user-friendly and provides a convenient, intuitive way to perform various operations. It has advanced features such as a computer software control system that enables the users to customize the system for their own needs, as well as for automated multi-step users. The device features a unique design, combining a horizontal-type sample stage, a digital imaging detector, and a high-performance electron gun. This allows the device to perform precise imaging of specimens in their various environments, as well as allows the user to navigate and explore features of the sample with greater precision. It is highly resistant to environmental contamination, as it can be used in a variety of labs with no risk of cross-contamination. The SEM is equipped with a high-resolution, long-distance objective lens, which can provide superb 3-dimensional imaging of the internal structure of a sample. This objective lens also features a charge-coupled device (CCD) detector to provide maximum pixel resolution. The device has powerful analytical capabilities that can be used to provide detailed elemental and chemical analysis. It is also equipped with an EDX detector, which is used to detect and measure the energy of the x-rays which are generated due to electron beam bombardment. Finally, the device features a high-power optical microscope that allows the users to carry out stereoscopic imaging. This is necessary to control the imaging quality and study the structure of the sample surface. It can also be combined with a universal specimen holder, which enables accurate positioning of the sample under the electron beam. Overall, Vega3 SBH is a powerful SEM that offers advanced imaging and analytical capabilities for a wide range of materials analysis applications. Its unique design, reliable performance, and intuitive user control make it an excellent choice for any scientific laboratory.
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