Used THERMO FISHER SCIENTIFIC / FEI FIB-611 #9239442 for sale

THERMO FISHER SCIENTIFIC / FEI FIB-611 Scanning Electron Microscope (SEM) is an all-in-one solution for advanced analytical and imaging needs. It combines a sophisticated field-emission scanning electron microscope unit with an external power source and an extensive range of standard hardware features. FEI FIB-611 offers a unique combination of large field-of-view imaging at high resolution with energy dispersive X-ray (EDX) analysis capabilities. With its unique view angle, THERMO FISHER SCIENTIFIC FIB-611 SEM is an optimal workhourse for biological applications and can accommodate a 4-headed scanning electron beam equipment, allowing for imaging and analysis simultaneously. FIB-611 SEM offers maximum flexibility in sample preparation. Its standard design includes a high pressure gas chamber which is capable of holding up to six variation samples at the same time, providing a high degree of flexibility and efficiency when multiple sample types are required. This chamber is temperature stabilized and a wide variety of configurations, including electro-optical systems, can be mounted on the inverted sample side. In addition, THERMO FISHER SCIENTIFIC / FEI FIB-611 includes an integrated vacuum-deposited evaporation unit, allowing for fast sample preparation of non-conductive samples. FEI FIB-611 SEM enables imaging of samples with a wide range of resolutions, from 0.8nm to 50nm. It also includes a high vacuum mode, allowing for high-resolution imaging of organic samples. THERMO FISHER SCIENTIFIC FIB-611 incorporates an EDX-system for chemical characterization and elemental mapping of samples at the nanometer scale. Luminescent analyses is possible with this unit as well, due to its built-in multi-channel detector and advanced image processing. FIB-611 SEM's multi-function design also allows for equipment customization in various ways. In order to match THERMO FISHER SCIENTIFIC / FEI FIB-611's capabilities with the specific needs of the user, various imaging, automation, and component accessories can be ordered to perform different tasks such as different types of imaging analysis, quantitative studies, and automated semi-quantitative analysis. In conclusion, FEI FIB-611 Scanning Electron Microscope is an all-in-one package for advanced analytical capabilities and imaging. It offers a unique combination of imaging, analysis and preparation flexibility, along with a high degree of resolution and wide field-of-view imaging. With its multi-function design, many components and accessories can be added or changed in order to match the machine with the user's specific needs.