Used THERMO SCIENTIFC Scios 2 HiVac #293798351 for sale
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ID: 293798351
Focused Ion Beam Scanning Electron Microscope (FIB-SEM)
Fast electronics for EDS processing
Motorized slide
OCTANE Elite super sensor area: 70 mm²
Remote control and troubleshooting of detector
Silicon nitride window with honeycomb grid
Liquid Nitrogen-free with integrated peltier cooling system
Input: 200 kcps
Energy resolution: 125 eV
Units:
Gauss
Tesla
Field: DC+AC
SEM/SDB Microscope
Cable Mount: Frame
DC Sensor
Sensor mount: SEM+Col
Cable: HHL (20m)
Frame: FrM
Co-ordinates: X, Y, Z Rectangular cartesian
Dynamic range (X): 29 mG (2.9 μT) pk-pk
Dynamic range (Y) : 17 mG (1.7 μT) pk-pk
Dynamic range (Z) : 38 mG (3.8 μT) pk-pk
SC24 Sensor
Ambient: ± 200 μT
Field cancelling factor: > 100 X at 50/60 Hz; > 400 X
Bandwidth: 5000 Hz
Display:
LCD Touch screen
Sensor dynamic range: 4.2 μT
Accuracy : ± 1.0 % ± 1 nT
X, Y, Z Real time field outputs
Scaling: 10 V/μT
Range: ± 12 V
Source resistance 10 K
Connectors: (3) BNC
Bandwidth: 25 Hz - 10 kHz, DC - 10 kHz
Power supply:120/240 V, 50/60 Hz, 100 VA.
The Thermo Scientific THERMO SCIENTIFC Scios 2 HiVac is an advanced scanning electron microscope (SEM) equipped with cutting-edge technology designed for high-vacuum imaging and analysis of a wide range of samples. This versatile instrument offers exceptional performance and imaging capabilities, making it an ideal tool for scientific research and materials characterization applications. Scios 2 HiVac features a high-vacuum design that enables imaging at high resolution, providing detailed surface information with superior contrast and clarity. Utilizing a Schottky field emission electron source, this SEM offers excellent beam brightness and stability, allowing for high-quality imaging of conductive and non-conductive samples alike. One of the key highlights of THERMO SCIENTIFC Scios 2 HiVac is its dynamic SEM column design, which combines high resolution with fast analytical capabilities. The unique TriProbe technology incorporated into this system enables simultaneous acquisition of multiple signals, including secondary electrons, backscattered electrons, and energy-dispersive X-ray spectroscopy (EDS) data. This multi-signal acquisition capability enhances the versatility and efficiency of the instrument, allowing for comprehensive sample characterization. Scios 2 HiVac is equipped with advanced software packages for image processing and analysis, providing users with powerful tools for quantification, particle analysis, and elemental mapping. The user-friendly interface allows for easy navigation and control of the microscope, enabling users to optimize imaging parameters and acquire valuable data with precision and accuracy. In addition to its imaging and analysis capabilities, THERMO SCIENTIFC Scios 2 HiVac offers versatile sample handling options to accommodate a wide range of sample types and sizes. The instrument features motorized stage control for automated sample positioning and navigation, as well as customizable sample holders and specimen preparation accessories for specialized applications. Furthermore, Scios 2 HiVac is designed for high-throughput sample analysis, with rapid imaging capabilities and efficient workflow management tools. The instrument is equipped with automated imaging modes and batch processing features, allowing users to streamline data acquisition and analysis for increased productivity. THERMO SCIENTIFC Scios 2 HiVac is also designed for reliability and ease of maintenance, with robust construction and intuitive system diagnostics for optimal performance and uptime. The instrument is equipped with advanced vacuum technology for efficient sample chamber evacuation and contamination control, ensuring consistent and reliable imaging results. Overall, the Thermo Scientific Scios 2 HiVac is a state-of-the-art scanning electron microscope that offers unmatched imaging and analytical capabilities for a wide range of scientific and industrial applications. With its advanced technology, versatile design, and user-friendly interface, this instrument sets a new standard for high-resolution microscopy and sample characterization.
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