Used TOPCON ABT-32 #9259781 for sale

TOPCON ABT-32 is a scanning electron microscope (SEM) designed for a wide range of uses in material science and quality control. It features an advanced secondary electron (SE) detector with superior signal-to-noise ratios and high resolution imaging capabilities. Its design allows for accurate analysis of thin films and submicron level geometries. ABT-32 is comprised of a high-power electron source, an imaging column, microprocessor, sample holder, and an array of detectors. Its electron source can supply a range of energies, from 1 to 15 kilo electron volts (keV). Its imaging column features an adjustable Magnification-Field-of-View (MFOV) system that allows for up to 260x magnification, allowing you to focus on details as small as 20nm. With its specially designed in-column Z balance, the user can quickly adjust the stability and speed of analysis. The microprocessor is capable of analyzing 16-bit images at up to 10 frames per second, which allows for high speed analysis of even the largest and most detailed samples. Its sample holder can accommodate a range of sample sizes and materials. And its detectors make it easier to identify smaller particles and collect fine detail. It features SE detectors for accurate analysis of thin films and sub-micron geometries, as well as secondary and backscatter detectors for energy dispersive spectroscopy (EDS) and x-ray mapping. TOPCON ABT-32's advanced features allow for detailed imaging of a variety of materials. Its efficient scanning procedure makes it ideal for detailed analysis of thin films and submicron geometries, ensuring the highest level of accuracy and precision available. With its various detectors and convenient sample holder, ABT-32 is the perfect tool for any material science and quality control application.