Used TOPCON ABT-32 #9293066 for sale

TOPCON ABT-32 is a scanning electron microscope (SEM) produced by TOPCON Corporation. This model is a mid-level SEM that offers high-resolution imaging performance with excellent analytical capabilities. The equipment includes an advanced digital imaging system, a Lanthanum hexaboride field emission source for maximum image quality, a versatile automated specimen stage, as well as a range of accessories. ABT-32 is capable of imaging specimens in the nanometer scale, up to a maximum resolution of 1.2 nm. The built-in digital imaging unit provides superb image clarity and features a 2.8 MP CCD camera and provides the user with a range of imaging modes including bright field, dark field, backscattered electron imaging (BEI) and secondary electron imaging (SEI). The automated specimen stage allows the user to image large areas of a sample, or to focus on a specific region. The machine also includes an automated spectrometer for elemental analysis. This includes a range of ultra-microanalytical techniques such as energy dispersive X-ray spectroscopy (EDX) and X-ray photoelectron spectroscopy (XPS). This feature can be used to identify, qualitatively and quantitatively, the chemical composition of the sample. TOPCON ABT-32 is also compatible with a range of accessories including sample holders and objective lenses. The lens selection includes high numerical aperture (NA) lenses with a minimum of 0.2 NA up to a maximum of 5.0 NA. These lenses can be used for various imaging tasks such as producing high-magnification images or for measuring high-resolution details. Overall ABT-32 is an excellent mid-level scanning electron microscope, providing excellent imaging performance, versatile functionality and excellent analytical capabilities. The SEM is suitable for a wide range of applications in industry, academia and research, as well as for use in education.