Used TOPCON DS 720 #9407852 for sale

TOPCON DS 720 is a scanning electron microscope (SEM), which provides high-resolution imaging and analysis of various sample materials. This instrument is well-suited for a variety of analytical tasks, ranging from nano-scale imaging to metallurgical surface analysis. DS 720 utilizes a Schottky field emission (FEI) electron source to allow for high resolution imaging of sample materials. This electron source is exceptionally stable and uniform, allowing for improved signal-to-noise ratios in recorded images. Additionally, TOPCON DS 720 features a variable pressure imaging chamber, which allows for a range of pressures to be applied to the samples. This variable pressure system allows for imaging at a number of different atmospheric conditions, depending on the type of sample being imaged. Additionally, the field emission gun of this instrument includes an active temperature and emission current stabilization systems, helping to further reduce any imaging noise. DS 720 offers an extremely wide range of magnification settings, with a maximum of 20,480x. This provides a great degree of flexibility when conducting analysis. This electrical and magnetic field guided column is driven by a series of closed-loop control systems, allowing for accuracy when changing settings. Additionally, the column is highly efficient under a broad range of settings, with a mirrored optimized for mid-range magnifications. Additionally, this equipment is equipped with a STEM detector, designed for imaging at the nanometer scale. This instrument is also capable of various elemental analysis techniques, such as energy-dispersive X-ray spectroscopy (EDS) and Auger electron spectroscopy (STEM-AES). With these tools, users can quickly and accurately analyze their sample materials for elemental composition and structure. TOPCON DS 720 provides users with an extremely capable piece of equipment for a variety of analytical and imaging tasks. The advanced control systems and imaging systems allow for detailed analysis and imaging of materials at nano-scale resolutions. Various elemental analysis techniques can be used with this tool as well, which further extend its analytical capabilities. DS 720 is an excellent choice for research and industrial applications alike.