Used TOPCON MI-3080 #293610473 for sale

TOPCON MI-3080 scanning electron microscope (SEM) is a powerful instrument used for microscopy and analysis of objects on the nanometer scale. With its high resolution digital imaging capability and advanced capabilities for materials research, MI-3080 is a powerful tool for scientists and engineers in a wide variety of fields. TOPCON MI-3080 features a wide-angle field lens which allows for rapid, macro imaging of samples. It is also capable of capturing nanometer-scale images, making it ideal for detailed characterization of small particles and fine structures. MI-3080 uses an energy filter to control the electron energy and optimize image resolution. The SEM has a detection efficiency of nearly 100 partners, which is essential for accurate, repeatable results. Crucially, TOPCON MI-3080 also boasts a wide range of software features, including a built-in image processor and acquisition software. This allows data to be collected, analyzed, and shared rapidly and conveniently. Additionally, MI-3080 can control the temperature and humidity, enabling sensitive biological sample analysis. The core of TOPCON MI-3080 is a redesigned scanning magnetic lens and an advanced digital imaging system. This allows for 40-fold magnification, powerful digital magnification, and a magnification of up to 30,000X. This is ideal for researchers who need to examine their samples in detail. MI-3080 also offers a range of electron detectors, such as the ultra-high resolution Schottky Inductive Analyzer, which allow for accurate chemical analysis. TOPCON MI-3080 provides excellent image resolution and is capable of producing fully developed images with resolution up to 1.0nm. Its advanced cooling and filter system also ensures that the image being captured is as clear and accurate as possible. Furthermore, MI-3080 also offers high-speed data acquisition which helps reduce the time needed for sample preparation and analysis. Overall, TOPCON MI-3080 is an advanced and reliable instrument that is capable of producing detailed, high-resolution images of small samples. It provides a convenient and efficient way of analysing and interpreting the structural and material properties of samples on the nanometer scale, making it an invaluable tool for researchers in a range of fields.