Used TOPCON MI-3080 #9137328 for sale

TOPCON MI-3080 is a high-performance scanning electron microscope (SEM), designed to support detailed material analysis. MI-3080 is a scanning electron microscope that combines the large field of view of a wide working distance optical microscope and a unique variable pressure microscope with the high spatial resolution of a scanning electron microscope. This high-end, versatile instrument allows users to acquire detailed elemental composition, morphology, and topography of a wide range of sample applications, including metals, ceramics, composites, semiconductors, polymers, and biological samples. TOPCON MI-3080 is equipped with a high vacuum chamber and a variety of detectors, including solid-state detectors, e-beam detectors and a CCD camera. The high vacuum chamber allows user to operate at higher magnifications and resolutions than achievable with traditional optical microscopes. The variety of detectors enables simultaneous signal acquisition from both the electron beam and the secondary electrons, thus providing the user with a wider range of analysis capabilities. MI-3080 also features an automated stage that can work with both the variable pressure and standard scanning electron modes. The standard mode makes samples ranging from luminescence to high resolution imaging possible with low voltage and low energy imaging. In the variable pressure mode, the vacuum system can be reduced to a reduced pressure environment suitable for examining organic materials. With the addition of variable pressure imaging, the instrument is capable of a larger selection of sample types and lower voltage imaging. TOPCON MI-3080 is designed to be user friendly, robust and dependable, and its ergonomic construction allows the user to save time and effort when investigating a range of samples. The one-touch control panel enables the user to quickly adjust settings, align and center images, and select the imaging mode. The intuitive graphical user interface also allows users to assign and save various settings for future use. In summary, MI-3080 is a scanning electron microscope capable of providing detailed information about materials on an atomic level. It combines the large field of view of an optical microscope with a variable pressure and high resolution scanning electron microscope, allowing users to examine organic materials as well as metallic, ceramic, composite, semiconductor and biological samples. Equipped with a range of detectors and a one-touch control panel, TOPCON MI-3080 is designed for environmental stability and ergonomic use.