Used TOPCON MI-3080 #9150383 for sale

TOPCON MI-3080 is a multi-mode scanning electron microscope (SEM) designed for high-resolution imaging and analysis of a wide range of specimen materials. This cutting-edge instrument features both low- and high-vacuum scanning electron microscopy (SEM) in addition to low-voltage environmental SEM (E-SEM). The integrated digital electronics make it highly versatile and suitable for a diverse range of applications from basic imaging to a variety of complex 3D analyses. The equipment boasts a digital imaging system that enables high-definition imaging with a resolution of up to 2 nanometers and an impressive 0.8 nm depth of focus. MI-3080's flexible design and advanced bellows-type stage allow for smooth imaging of specimens up to a size of 300 mm x 290 mm. In addition, the unit has been designed to be user-friendly, so even novice users can be up and running quickly. For advanced analysis, TOPCON MI-3080 is equipped with a wide range of functionality. The instrument includes backscattering electron (BSE) detection with both medium- and low-voltage imaging capabilities. It also comes with a range of imaging techniques such as BSED in low-voltage mode, SE backscattering imaging in medium-voltage mode, and Gaseous Detector Secondary Electron Imaging (GADSEI) at low and medium voltage. For elemental analysis, MI-3080 is equipped with a range of detectors, including an energy dispersive X-Ray (EDS) machine with 4K spectrum resolution and a wavelength dispersive X-Ray (WDS) tool for high-resolution elemental mapping. These detections can be used to perform a variety of elemental analysis such as phase analysis, compositional mapping, and grain size imaging. In addition, the instrument is compatible with several accessories, including a charged particle detector for ion and electron column analysis and a range of additional software tools. This provides superior functionality for a wide range of 3D analyses, such as analytical FIB-SEM (Focused Ion Beam - Scanning Electron Microscopy), EBSD (Electron Backscatter Diffraction) and 3D printing. Overall, TOPCON MI-3080 is an advanced multi-mode SEM designed to enable high-resolution imaging and analysis of a wide range of specimen materials. The comprehensive imaging features, versatile asset design, and advanced analysis capabilities make it ideal for a broad range of applications.