Used TOPCON MI-5080 #293610467 for sale

TOPCON MI-5080 is a scanning electron microscope (SEM) that offers high resolution imaging capabilities in a compact and economical package. It has a magnification range of up to 50,000x, a resolution of 1 nanometer, and a field of view up to 115.24mm In addition, the SEM has an Electron Energy Dispersive X-Ray (EDX) equipment,which allows for elemental analysis of samples down to the atomic level. The system also has an automated stage that enables precise sample positioning for focused observation and enable batch imaging for rapid project throughput. MI-5080 has a high-resolution Schottky FE-SEM detector, coupled with a digital image processing unit, which provides clear and crisp images in both 2D and 3D. It also comes equipped with a backscattered electron (BSE) detector, which can be used to detect topographical differences in surface samples. This provides improved contrast between regions on the sample and an enhanced ability to distinguish features in complex samples. TOPCON MI-5080 is designed for maximum versatility and incorporates the latest technology, with an automated stage, computer-controlled operation, and an intuitive interface. It utilizes advanced software for rapid image acquisition, automated image stitching, image analysis, and pattern recognition. The SEM is supported by an open architecture, which allows it to easily integrate into pre-existing lab systems. It also has a range of external accessory options, such as an EDS machine, video camera, and optional beam blanker, allowing for a variety of research options. MI-5080 is an ideal solution for many applications, including semiconductor research, biological specimen observation and analysis, surface contamination analysis, forensic analysis, and industrial applications. It is user-friendly and reliable, with a modular design, which makes it easy to upgrade and maintain. Overall, TOPCON MI-5080 is a powerful SEM with a range of advanced features, making it suitable for a wide range of applications.