Used TOPCON SM 300 #293628530 for sale

TOPCON SM 300 is a scanning electron microscope (SEM) designed to provide high resolution imaging and analysis of samples such as metals, ceramics, and composites. SM 300 features a large chamber capacity, allowing the user to quickly switch from biological samples to circuit boards or other large items, depending on their analysis needs. The instrument scans samples with an electron beam and collects secondary electrons which are then displayed as an image on an integrated display. This image can be manipulated by adjusting the angle of the beam, zooming in and out, panning and rotating the image, and changing the brightness, contrast, and color of the image. TOPCON SM 300 is equipped with an advanced imaging system that uses a variable pressure chamber to optimize imaging parameters. This Advanced Imaging System (AIS) offers the user precise control of the environment surrounding the sample and provides excellent imaging condition thanks to precise control of temperature, humidity and other parameters. SM 300 features a high resolution detector and powerful analytical capabilities. It provides precise automated image stitching functions and precise 3D imaging capabilities. This enables the user to accurately measure precise surface features and structures down to the sub-micron level. Additionally, the instrument is capable of X-beam elemental analysis with the ability to detect and identify an unlimited number of elements. Spectral mapping is also possible with the instrument, allowing the user to map and analyze the elemental composition of a sample, which can provide important insight into the composition and structure of a material. Finally, TOPCON SM 300 is equipped with a number of automated image processing and manipulation functions, allowing the user to automatically remove artifacts, blur edges, adjust brightness and contrast, classify particles, filter noise, or create 3D models from the images. The instrument is also capable of microanalysis, allowing the user to measure the exact ratio of elements in a sample. Overall, SM 300 is a high resolution scanning electron microscope that is capable of a wide range of applications. It is ideal for research, industrial and educational use, offering high quality imaging, precise automated imaging stitching functions, powerful analysis capabilities, and a variety of automated image processing and manipulation functions. TOPCON SM 300 is the perfect choice for any laboratory that requires precise imaging, elemental analysis, and microanalysis.