Used TOPCON SM 300 #9374722 for sale

TOPCON SM 300 is a scanning electron microscope (SEM) designed for use in research and industrial settings. With a resolution of 1.8 nm and a voltage range up to 30kV, it is capable of generating high-resolution images and data quickly and easily. SM 300 is equipped with an SC-9100 EDX equipment with automated analyzing functions, including lapd, selops, and x-ray intensity analysis. The EDX system allows for simultaneous detection of multiple elements in a single sample. By using automated image data acquisition, users can easily scan a wide area and generate images with maximum efficiency. The SEM works on secondary electron imaging with a broad range of brightness, contrast, stigmation, focus, and other ready-made settings. With its digital image processing, TOPCON SM 300 can generate images up to 128 megapixels in size for detailed analysis and interpretation, allowing users to configure stunning visuals with ease. SM 300 is also capable of high-resolution imaging with topographical sample integration. This feature allows users to generate an image that contains both topographic and microscopic information without the need for separate analyses. Additionally, TOPCON SM 300 can perform advanced 3D imaging with its 3D TOM unit, enabling users to visualize the structure, composition, and topography of a sample with ease. SM 300 is also equipped with a sample stage capable of tilt, twist, and rotation, allowing for more precise imaging. Its high-speed and high-resolution automated z-axis adjustment allows users to focus on the desired area with ease. TOPCON SM 300 is a highly powerful SEM capable of producing high-resolution images and data quickly and easily. With its EDX machine, automated image data acquisition, advanced image processing, and topographical sample integration capabilities, SM 300 is an invaluable tool for research and industrial environments.