Used TOPCON SM 350 #9257166 for sale

TOPCON SM 350 is a scanning electron microscope (SEM) from TOPCON Precision Instruments designed for imaging and analysis of samples with high resolution. This model offers a variety of features and capabilities for imaging even the finest details. SM 350 is designed to provide high-resolution imaging of specimens. Its design features a low-voltage field emission source, providing an extremely long electron source lifetime up to 5000 hours, enabling a high contrast and long-term imaging of specimens. This SEM model is able to operate at up to 200 kV/3kV enabling accurate analysis of samples. The SEM features an environmental scanning electron microscope (ESEM) option. This function allows imaging of specimens that are sensitive to high vacuum and generates gases due to the electron beam irradiation. The SEM can operate in either high or low vacuum mode, providing the best conditions for the chosen sample. TOPCON SM 350 is able to detect a variety of elemental species, including C, O, S, N, H and element groupings such as B, Cl, and Si. It has two detectors; the secondary electron detector and backscattered electron detector, to give information about the chemical composition and surface topography of the specimen. It also comes with a CET (cryogenic energy transfer) machine, which allows for sample specific temperature modulation. The SEM is very easy to use: the software interface is user-friendly and provides a range of imaging options and functions. It is equipped with an automated stage, allowing for fast acquisition of multiple specimens and sample preparation. SM 350 also allows for easy save and restore of imaging and analysis settings. TOPCON SM 350 provides superior performance and image quality, even for the smallest samples. With its innovative features and high resolution imaging, it offers an excellent tool for imaging and research applications.