Used ZEISS 10A #293635771 for sale

ZEISS 10A Scanning Electron Microscope is an advanced device used for investigating microscopic structures in great detail. It is composed of an electron column, components for producing an electron beam, and a sample chamber for vaporising samples. The electron column revolves around a common axis and contains two condenser lenses, a Wehnelt cap, and an immersion objective lens to focus and maintain a downward directed electron beam at a very tight convergence. This allows for precise scanning of the sample with a wide field of view. The sample chamber contains the sample platform and a vacuum control system. The sample platform can be heated to temperatures up to 3,000 degrees Celsius which is used to evaporate organic and biological samples while still maintaining the vacuum within the chamber. The electron beam is then scanned over the sample being studied, with the electrons being absorbed by the atoms or reflected back to the detector. The reflected electrons are recorded and then converted into an image of the sample showing the detailed microstructure of the specimen. 10A is often used for investigating the mechanical, physical, and chemical properties of a sample such as its surface topography, grain size, and crystal structure. It is also a valuable tool for observation of failure in electric- and electronic components. Finally, ZEISS 10A is also capable of producing secondary electron and backscattered electron imaging. Secondary electrons are detected from the sample's surface generating a topographic image of the sample, while backscattered electrons are detected from deeper regions within the sample and generate characteristic qualities of the materials being studied such as the sample's chemical composition.