Used ZEISS 1560 #9353524 for sale

A ZEISS 1560 scanning electron microscope is a type of electron microscope used in materials science. This microscope uses a scanning electron beam to generate images and to analyze samples at high magnifications. It is a versatile and powerful tool that can be used to examine a variety of samples from biological specimens to materials in research and industry. 1560 is able to observe samples from the nano-scale to the macro-scale and can achieve up to 1500x magnification. The microscope features a high-resolution digital camera that allows for detailed image acquisition and analysis. An additional X-ray detector can be used to detect the presence of elements and compounds of interest in the sample being examined. This microscope also has a high-intensity electron source and a vacuum chamber that can be used to control the environment of the sample being examined. ZEISS 1560 is suitable for a variety of analytical tasks and can be used to study surface topography, texture, and crystal structure as well as elemental composition. It can be used to analyze the shape and size of particles, as well as for characterization of living cells and organs. Furthermore, it is possible to map materials with a range of resolutions, from a few hundred nanometers to several micrometers. 1560 is equipped with an automated interface and includes a Joystick system that can be used to precisely control the beam's direction and the scan path. Additionally, the microscope includes software that can be used to facilitate automated image and data acquisition. This feature is especially useful for the accurate and fast analysis of multiple areas in samples. ZEISS 1560 is also effective in detecting and measuring properties of microstructures, such as thickness, grain sizes, and surface characteristics. Overall, 1560 provides a comprehensive solution for a wide variety of materials science research and can be used to examine a wide range of samples. Additionally, its automation makes it especially useful for the analysis of large volumes of data and for preparation of highly precise samples.