Used ZEISS Auriga #9067317 for sale
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ID: 9067317
Vintage: 2011
Focused Ion Beam Scanning Electron Microscope (FIB SEM)
GEMINI Optik with 0.1-30 kV Emission voltage
Resolution: Approximate 1.9 nm at 1 kV
In-lens secondary electron detector
Chamber secondary electron detector
Energy selective back scatter electron detector (ESB)
(2) Internal infrared CCD cameras
Cobra FIB pillar with low voltage option
Floodgate: 80 mm
BRUKER Quantax 800 EDX System
ZEISS STEM Detector retractable
KLEINDIEK Micro manipulator system
Includes:
Gas injection system (Platinum, carbon)
OXFORD INSTRUMENTS XMAX 51-XMX0085 Electron beam, 31"
Electron beam
Iron beam (FIB)
Pumps
TEM Detector
Secondary electron detector
Load locker
Vacuum pump
Chiller
(3) HEWLETT-PACKARD COMPAQ LA1951g Computer screens
KLEINDIEK Nanotechnik needle system
ZEISS Controller
ZEISS Keyboard / Controller
Anti vibration table
Auxiliary chiller
Vacuum pump
Computer
(2) Screen joysticks
Transportation-locks
Accessories
CE Marked
Power supply: 230 V, 50/60 Hz
2011 vintage.
ZEISS Auriga is a scanning electron microscope (SEM) which is capable of high resolution imaging, elemental composition, and surface analysis for a wide range of materials. Auriga is equipped with a patented secondary electron detector, providing a high angle of acceptance, coupled with its large signal to noise ratio, for superior atomic and nanoscopic imaging. It can generate electron images of up to 1.3 nano-meters (nm). The imaging characteristics of ZEISS Auriga result in excellent contrast and an unparalleled level of detail. Auriga is also equipped with an Oxford Instruments EDX detector capable of performing elemental analysis. This can be used to collect data on the composition of materials for a variety of applications. ZEISS Auriga's EDX capabilities are further augmented by its Energy Dispersive X-ray Microanalysis (EDXMA) software, which allow users to process and analyze their data with advanced features. In terms of surface analysis, Auriga is equipped with an in-situ AFM. This allows for topographical mapping of a variety of materials and the characterization of surface roughness, particle size, and mechanical properties. The high resolution of this tool also allows for analysis of nanostructures, such as quantum dots. Overall, ZEISS Auriga is an exceptional SEM, offering high resolution imaging, elemental composition, and surface analysis capabilities, all of which can be used for a variety of materials. The flexibility of this tool allows for a wide range of applications, making it an excellent choice for any laboratory.
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