Used ZEISS Crossbeam 1540 EsB #9260604 for sale

ZEISS Crossbeam 1540 EsB Scanning Electron Microscope is a powerful tool for imaging and characterizing the structural, microstructural, and electrical properties of a range of materials at very high resolutions. The EsB (Electron-Scanning backscattered) mode offers superior imaging with resolution of up to 1nm and up to a depth of field reaches of over 500nm for superior 3D imaging. The EsB mode is ideal for inspecting composites, multi-layer thin films and microelectronic devices. It allows the dynamic visualization of surface and surface interaction of materials. Additionally, Crossbeam 1540 EsB has large 4inch double TEM sample holders for easy specimen loading and positioning. The advanced imaging software included with ZEISS Crossbeam 1540 EsB enables fast real time imaging of samples. This allows the user to quickly obtain detailed information on the sample by specifying imaging parameters, for example contrast, size, and orientation. Crossbeam 1540 EsB is also capable of both monochromatic and polychromatic imaging, while simultaneous BSE and SE imaging can be used to create image combinations for accurate sample quantification. ZEISS Crossbeam 1540 EsB also features automated features like automated surface feature recognition and surface texture analysis. Automated measurements can be performed for specimen's dimensions, angles, distances, and volume. Additionally, the microscope provides status information at each step in the imaging process to ensure optimal results. Finally, Crossbeam 1540 EsB is designed for ease of use. It supports single-click operation of various electron beam techniques and automation across different setup configurations. Integrated components minimize setup time and operator presets ensure reproducibility in future studies. Additionally, ZEISS Crossbeam 1540 EsB includes Wi-Fi connectivity and an out-of-the-box USB interface to provide superior data storage and access options.