Used ZEISS Crossbeam 1540 EsB #9314992 for sale

ZEISS Crossbeam 1540 EsB Scanning Electron Microscope (SEM) is a high-performance platform designed for research, industrial, and life sciences applications. It is equipped with a detector package that includes a dual-axis deflector and secondary electron detector for very high resolution imaging. Additionally, the equipment is integrated with advanced, automated sample preparation and navigation as well as an electron beam imaging and analysis system controlled through the built-in ZEISS WorkSpace software. The SEM has a voltage range of 0-30 kV and an acceleration voltage up to 15kV, allowing for imaging samples up to 500 μm thick. The sample chamber is capable of holding up to 200 kg of weight and comes with features such as automatic and programmable pressure, cryo-preparation and vacuum pumps. The detector unit includes high resolution, energy-filtered imaging, backscattered electron imaging, and EDS (Energy Dispersive Spectroscopy). The electron optics are equipped with three deflection coils, providing up to 6 nm resolution in secondary electron mode, and up to 0.7 nm resolution in STEM (Scanning Transmission Electron Microscopy) mode. Crossbeam 1540 EsB SEM has sample navigation and manipulation features such as automated slide transport, 3-axis sample stage, 6-axis sample stage, and a table-top sample manipulator. The navigation machine is highly efficient, with an advanced user interface allowing for manual sample alignment, navigation, and focus. The SEM also comes with a full suite of automation options such as automatic sample search, alignment and analysis/reporting capabilities, allowing for high sample throughput. For added convenience, the microscope has built-in features such as an automated particle-size and morphology analysis, automated sample loading and unloading, and a dual-axis motorized electron beam pressure scanner. Additionally, the SEM includes stage loads of up to 200 kg and a robust set of data reporting and statistical analysis tools, allowing for reliable and consistent results. ZEISS Crossbeam 1540 EsB SEM is a versatile and powerful tool for imaging and analyzing a wide range of samples. It provides researchers and industrial scientists with advanced imaging and analysis capabilities, allowing for highly accurate and comprehensive sample analysis. With its resolution, speed, and high throughput capabilities, the tool offers an efficient and user-friendly platform for a range of applications.