Used ZEISS EM 109 #293610285 for sale

ZEISS EM 109 scanning electron microscope (SEM) is a high-performance analytical instrument that enables a high-resolution, three-dimensional imaging of surface morphology and nanostructure of a wide range of materials. It has a large chamber that can accommodate up to a twenty-five millimeter diameter specimen and is capable of magnifying a sample up to 400,000 times its original size. The SEM features secondary and backscatter electron detectors to detect various features of sample, and also an energy dispersive spectroscopy (EDS) detector to detect the elemental composition of sample in the surrounding volume. EM 109 SEM is equipped with a high vacuum system to minimize the interactions between specimen and the environment, enabling accurate image acquisition. Its high-resolution imaging and the ability to detect structure and elemental composition makes it an ideal tool for analyzing microscopic surface features and nanostructure. With the ability to achieve resolutions down to 1 nanometer, the SEM is capable of resolving fine details of the surface and its associated nanostructure. The imaging capabilities of ZEISS EM 109 SEM are further enhanced by its automated stage allowing for travel of up to fifty-five millimeters with a nanometer resolution. Automated image stitching and auto-exposure provide for accurate, reproducible images and significantly reduce the time needed for the acquisition of the imaging data. This allows the user to rapidly acquire high-resolution images of large area samples. EM 109 SEM also incorporates comprehensive software suites for both data acquisition and analysis. This allows for automated imaging and analysis as well as post-processed analysis to create 3D reconstructions and volumetric images for even further insight into the sample's microstructure. In addition to its imaging capabilities, ZEISS EM 109 SEM is an excellent platform for material characterization, providing users with a range of digital and measurement analysis tools. The SEM combines advanced hardware and software systems to allow the user to accurately measure sample dimensions with down to a nanometer level of precision. It also has the ability to detect atomic column misalignment, grain boundaries and planar defects, quantify grain size and orientation, and characterize surface roughness. Overall, EM 109 SEM is an invaluable and versatile tool that allows scientists to carry out in-depth analysis and characterization of a wide variety of materials. With its high-resolution imaging capabilities and powerful data analysis tools, it can provide users with invaluable insight into a sample's microstructure and atomic features.