Used ZEISS EM 901 #9362634 for sale

ZEISS EM 901 is a scanning electron microscope (SEM) that is used for imaging and analysis of samples in an electron microscope environment. It can be used for imaging a range of materials from organic tissues and biological cells to metals and inorganic compounds. EM 901 features an in-lens secondary electron detector to provide excellent high resolution imaging of surface structures in a finely focused, low electron-energy beam. This imaging is achieved through the use of a wave length spectrograph which ensures a high contrast between the sample signal and the background noise. In addition, ZEISS EM 901 has a generous working distance range of 35-450 mm and a range of aperture sizes, allowing it to be adapted to a range of sample types and sizes. EM 901 includes an automated surface analysis program which can be used to measure the surface area of a sample and a semi-automatic focus calibration routine to improve imaging resolution and improve image quality. It also has a variable-pressure environment which can be used for imaging non-conductive samples. In order to ensure maximum performance and reliability, ZEISS EM 901 is constructed using robust and reliable components, including a stage that can support specimens of up to 10 kg, an in-column thermal emitter that helps to minimize drift and an automated sample exchange system. Moreover, its cooling system is designed to protect delicate samples by maintaining a low temperature at the interface between the sample and the electron column. Finally, EM 901 is backed up by a dedicated application support program that helps customers achieve the best imaging results and provides assistance in the design of experiments. This program also includes a comprehensive suite of software tools which can be used for collecting, processing and analyzing images.