Used ZEISS EVO 40 #293592536 for sale

ZEISS EVO 40 Scanning Electron Microscope (SEM) is a high resolution imaging tool used for the examination of specimens at the nanoscale. With a maximum working distance of one millimeter, a small spot field of view (FOV) of 5nm and a resolution of up to 5µm, EVO 40 is an excellent choice for extremely precise imaging and analysis. ZEISS EVO 40 is an aberration-corrected SEM with a cold field emission gun (FEG) and thin film coating capabilities. The FEG creates a highly focused beam of electrons that can produce extraordinarily smooth surface images with low noise and very good edge definition. The thin film coating process provides a thin layer of protection to the specimen surface while allowing high detectability and contrast of the electron beam. EVO 40 also includes a backscatter detector and secondary electron detector, which allow for highly detailed images of various properties including surface composition, grain size, and other characteristics of surfaces. ZEISS EVO 40 also includes advanced software to provide enhanced image analysis. Advanced measuring and imaging tools such as 3D reconstruction, line scan, and advanced contrast methods are also available. These tools enable the user to perform a variety of measurements including morphology, area and dimensional measurements, surface roughness and crystallinity, and complex device structures. Additionally, EVO 40 offers a variety of specimen holders to ensure compatibility and safety. ZEISS EVO 40 is constructed with a high-performance optical and scanning electron microscope main unit. The instrument is designed for safe operation and maintenance, providing features such as a built-in safety system, a temperature monitoring and warning system, and an independent key for locking the microscope to ensure safe use. The user interface is intuitive, offering simple graphic user interfaces as well as advanced measurement and imaging tools. EVO 40 offers unique, high-precision imaging capabilities at an affordable price, making it an ideal SEM for a wide range of applications. With the personal interface, accurate imaging, and reliable coatings and detectors, ZEISS EVO 40 is the perfect tool for microscopy research and analysis.