Used ZEISS EVO 40 #9400381 for sale

ZEISS EVO 40 is a scanning electron microscope for high-resolution imaging of samples at magnifications up to 500,000x. It uses a field emission gun (FEG) to emit a high-energy electron beam over a wide area and can achieve dynamic detection from 30eV to 30kV. This scanning electron microscope makes use of a full range of advanced imaging techniques, including secondary and backscattered electron imaging, scanning transmission electron microscopy, and energy-dispersive X-ray spectroscopy. Additionally, EVO 40 offers tilt, pan, and sample alignment capabilities, as well as an automated special and variable pressure mode. ZEISS EVO 40 is fitted with a variety of scanning devices, including a variable pressure control camera and digital imaging detection systems. The variable pressure control camera is equipped with digital imaging control, sensitivity adjustment, and spectral distribution selection. The digital imaging detection system includes a 12-bit charge-coupled device detector and gigabit ethernet communications ports. This allows for rapid scanning and imaging of samples in both low and high magnification settings. For sample preparation, EVO 40 features a variety of manipulation stages, such as the adjustable stage, depth control stage, sample translation stage, and pre-alignment stage. This equipment allows for simplified sample preparation and sample movements. Image and data analysis are made easier by ZEISS EVO 40's Advanced Image Analysis (AIA) software. This software can be used to measure, analyze, compare, and trend data values, as well as to create 3D or 4D images using the captured data. Additionally, the user interface is designed for easy operation and data management. Overall, EVO 40 is a powerful scanning electron microscope that offers superior image resolution, versatile imaging capabilities, and automated features. It is well-suited for imaging and analysis of a wide range of samples, enabling users to capture high-resolution images with ease.