Used ZEISS EVO 50 VP #293762728 for sale

ZEISS EVO 50 VP
ID: 293762728
Scanning Electron Microscope (SEM).
ZEISS EVO 50 VP scanning electron microscope (SEM) is an advanced tool designed to deliver top-notch imaging performance. It is based on Patented field emission gun (FEG) technology, delivering higher acceleration voltages for greater flexibility and imaging capabilities. The superb performance of this microscope is delivered by the innovative ZEISS Palanix platform, which offers exceptional productivity, flexibility and performance. This world-class microscope has been designed to be ergonomic and provide users with an intuitive workflow. With its in-lens detector and field emission source, this microscope is able to acquire images of very high resolution and contrast. The Twin Lens System has been designed to minimize unwanted noise and optimize image sharpness. Additionally, optimized electron optics coupled with advanced image processing enables exceptional imaging results. EVO 50 VP SEM offers resolutions from 0.2nm up to over 5,000nm, making it capable of imaging a wide range of object types from small biological materials to large-scale objects. The microscope can also detect and analyze a wide range of material properties such as microstructure, composition and crystal structure. Additionally, advanced automated imaging tools within the microscope help speed-up workflow and the entire imaging process. Other features of ZEISS EVO 50 VP include the Tropes ED EDS detector, which provides spectral imaging capabilities; ZEISS Energy Filter Detector (EFD) which is used for Z-contrast imaging; and ZEISS Everhart-Thornley detector, which can detect secondary electrons, backscattering electrons, and reflection electrons. Furthermore, EVO 50 VP has customizable user settings to ensure user-friendly operation, and a large observation chamber so that specimens can be processed in-situ. The internal detector unit provides X-ray data for elemental analysis and phase composition analysis, while a wide range of external stages allows for specimen manipulation. With its powerful but user friendly features, this SEM delivers superior imaging capabilities whatever the application.
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