Used ZEISS EVO 50 #293632015 for sale
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ZEISS EVO 50 is a leading scanning electron microscope that is composed of very precise optical technology, allowing for high-resolution imaging and detailed analysis of materials and surfaces. This advanced equipment provides excellent depth resolution, fast automation and digital imaging capabilities that make it the ideal instrument for biological and industrial applications. With its advanced column design and powerful electron optics, EVO 50 offers optimized images with a superior depth of focus, even at low beam energies. This microscope easily provides an impressive 15-20 nm resolution, allowing for close examination of a wide range of samples. The digital imaging capabilities also provide users with an ability to document and save pictures for later reference. The specimen chamber of ZEISS EVO 50 can accommodate very large samples and a variety of holders, including those for both bulk and high vacuum operation. The large chamber limits the need to exchange the sample and allows the user to quickly alternates between the low, medium and high vacuum modes while viewing a sample in a single session. EVO 50 offers multiple automated functions that ensure top-of-the-line operation. Automated operating parameters and a wide variety of software packages expand the range of possible applications. This microscope is also offered with a range of optional accessories, including a cryostat for low-temperature analyses, a differential interference microscope and a carbon-evaporation gun. The control and display systems of ZEISS EVO 50 have been ergonomically designed to meet the needs of a wide variety of users. The display includes an intuitive graphical user interface and provides clear images that can be adjusted as required to meet individual requirements. The technology used in EVO 50 ensures a host of features typically found in more expensive models. This quality scanning electron microscope is able to basically cover all requirements from the professional microscopist, from specimen preparation to image analysis.
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