Used ZEISS EVO 50 #293830550 for sale

ZEISS EVO 50 is a high-performance scanning electron microscope (SEM). A scanning electron microscope enables imaging of objects from a few nanometers up to several millimeters in size. It is a critical tool for a variety of research and materials science applications, from the imaging of nanomaterials to the analysis of microstructures and organic materials. EVO 50 is an advanced model of SEM, utilizing the latest technology to provide high resolution imaging, superior depth of field, and excellent surface quality. It is equipped with a state-of-the-art Schottky field emission gun (FEG) which offers ultra-low accelerating and electron landing voltage, resulting in superior resolution and image quality. The gun is also capable of performing both low-dose and high current imaging, allowing for efficient sample investigation. Furthermore, the instrument has a high-frequency, high-contrast cathode for stable and repeatable imaging. ZEISS EVO 50 has a chamber pressure of 2 x 10-5 mbar, enabling precise manipulation of vacuum and atomization conditions, critical for reliable operation. Additionally, due to its large dynamic range, it can handle multiple sample types, from organic and biological materials to macroscopic objects and solid thin films. EVO 50 is equipped with a secondary electron (SE) detector and a back scattered electron (BSE) detector for advanced imaging capabilities. The SE detector is capable of producing high-contrast, high-resolution images with excellent depth of field, allowing for detailed observation of the samples. On the other hand, the BSE detector is ideal for imaging surface topography and composition of macroscopic and nanoscale features. To facilitate sample analysis, ZEISS EVO 50 comes with advanced sample handling tools such as a piezoelectric sample holder, Environmental SEM (ESEM) chamber, and a drift compensation feature. The piezoelectric sample holder is able to support samples up to 50 kg in weight, and tilting and rotating through varying angles. The ESEM chamber is a pressure-controlled environment chamber, specifically designed for conducting analysis of wet samples and non-conductive/low-conductive samples. Finally, the drift compensation feature allows the instrument to reduce any unwanted sample movement or vibration, ensuring accurate data acquisition in a fluctuating environment. Overall, EVO 50 is an advanced, feature-rich scanning electron microscope offering superior imaging and analytical capabilities. It is an ideal solution for a variety of research and materials science applications where high resolution imaging and analysis are required.