Used ZEISS EVO 50 #9378143 for sale

ZEISS EVO 50 is a scanning electron microscope (SEM) that combines innovative features with user-friendly operation. Optical and electron imaging capabilities make EVO 50 ideally suited for many applications, from materials science and metallography to nanotechnology and regulatory compliance. Developed with ZEISS renowned design, ZEISS EVO 50 features the comfort of an ergonomic user interface, powerful analysis software and high-resolution equipment to deliver detailed imaging for accurate quantification and analysis of specimens. This SEM is fitted with an Everhart-Thornley SE detector with Coincident Detection Imaging (CDI) for simultaneous operation of secondary and backscatter electrons. EVO 50's state-of-the-art design includes motorized lenses, a pendant display panel for hands-free operation and an integrated control unit for operation and control functions. An automated specimen exchange system allows users to quickly switch between the four available specimen holders, giving researchers the ability to make rapid changes to their imaging parameters with minimal effort. ZEISS EVO 50 offers an extended field of view for comprehensive coverage of samples and allows users to make quantitative measurements and 3D analyses. An integrated energy dispersive X-ray (EDX) spectrometer is used to identify the composition of specimens and produce elemental maps. The integrated lattice detector enables detailed crystalline analyses of specimens. With its built-in software, EVO 50 allows users to acquire images, generate analysis reports and control settings. A range of reconstruction and image processing functions are also available, allowing users to perform automated image analysis. Additionally, the software can store data for long-term archival and sharing of data. In summary, ZEISS EVO 50 is a highly versatile scanning electron microscope, designed for areas such as material science and nanotechnology research. It provides users with advanced imaging capabilities, an intuitive user interface, and sophisticated image analysis and analysis software for maximum performance.